| # SPDX-License-Identifier: (GPL-2.0-only OR BSD-2-Clause) |
| # Copyright (C) 2025 Texas Instruments Incorporated |
| %YAML 1.2 |
| --- |
| $id: http://devicetree.org/schemas/soc/ti/ti,j784s4-bist.yaml# |
| $schema: http://devicetree.org/meta-schemas/core.yaml# |
| |
| title: Texas Instruments K3 BIST |
| |
| maintainers: |
| - Neha Malcom Francis <n-francis@ti.com> |
| |
| allOf: |
| - $ref: /schemas/arm/keystone/ti,k3-sci-common.yaml# |
| |
| description: |
| The BIST (Built-In Self Test) module is an IP block present in K3 devices |
| that support triggering of BIST tests, both PBIST (Memory BIST) and LBIST |
| (Logic BIST) on a core. Both tests are destructive in nature. At boot, BIST |
| is executed by hardware for the MCU domain automatically as part of HW POST. |
| |
| properties: |
| compatible: |
| const: ti,j784s4-bist |
| |
| reg: |
| maxItems: 2 |
| |
| reg-names: |
| items: |
| - const: cfg |
| - const: ctrl_mmr |
| |
| clocks: |
| maxItems: 1 |
| |
| power-domains: |
| maxItems: 1 |
| |
| required: |
| - compatible |
| - reg |
| - reg-names |
| - ti,sci-dev-id |
| |
| unevaluatedProperties: false |
| |
| examples: |
| - | |
| #include <dt-bindings/soc/ti,sci_pm_domain.h> |
| bus { |
| #address-cells = <2>; |
| #size-cells = <2>; |
| safety-selftest@33c0000 { |
| compatible = "ti,j784s4-bist"; |
| reg = <0x00 0x033c0000 0x00 0x400>, |
| <0x00 0x0010c1a0 0x00 0x01c>; |
| reg-names = "cfg", "ctrl_mmr"; |
| clocks = <&k3_clks 237 7>; |
| power-domains = <&k3_pds 237 TI_SCI_PD_EXCLUSIVE>; |
| ti,sci-dev-id = <234>; |
| }; |
| }; |
